The Materials and Devices Testing Technology Center at Tsinghua University’s Shenzhen International Graduate School (formerly the Materials and Devices Testing Center at Tsinghua University’s Shenzhen Graduate School) was established in 2008. Accredited by the China National Accreditation Service for Conformity Assessment (CNAS) in 2013 and authorized by the Canadian Standards Association (CSA) in 2016. The testing center is a crucial institution that provides impartial and authoritative test data for scientific research and quality assessment both within and outside the school.

Material inspection:

Microscopic morphology observation and measurement (TEM, SEM, In-Situ AFM, STM, MBE, ALD, FIB, CP, TXP, ion thinning instrument, metallographic microscope)
Component analysis (combined TG-DSC-IR-GC-MS, TG-MS, in-situ XRD, in-situ Raman & TERS, in-situFTIR&NanoIR、UV-VIS-NIR、GC-MS、GC、IC、XPS、TOF-SIMS、EDS、EELS、ICP-OES、ICP-MS、CHNOS、CS）
Thermal Performance Analysis of Materials (TG-DSC, TG, DSC, DMA, TMA, Laser Thermal Conductivity Analyzer, Interfacial Thermal Resistance Analyzer)
Analysis of other physical properties of materials (nano-indentation, contact angle, surface tension, density, hardness, viscosity, specific surface area, Abbe refractive index, etc.)
Analysis of material electrochemical properties (battery assembly, charge-discharge equipment, electrochemical workstations, etc.)

Component testing:

Non-destructive testing (CT, ultrasonic scanning)
Battery Electrical Performance Testing (electrodes, modules, battery pack charge/discharge cabinets, temperature chambers)
Battery Safety Performance Testing (ARC, ambient/high-temperature external short circuit, overcharging, overcurrent, overload, low pressure, temperature cycling, vibration, acceleration impact, drop test, crush test, heavy object impact, thermal abuse, combustion ejection, washing, needle penetration, electrostatic discharge)
Battery Failure Analysis.