XPS & XRD Analysis of ITO/ZnO Nanolaminate Thin Films for TFT Research

A researcher is seeking a qualified analytical laboratory or university characterization facility capable of performing X-ray Photoelectron Spectroscopy (XPS) and X-ray Diffraction (XRD) analysis on ITO/ZnO nanolaminate thin-film samples used in TFT-related research applications.

The requested XPS analysis focuses on oxygen chemical-state characterization, including high-resolution O 1s peak deconvolution to estimate the relative contribution of lattice metal–oxygen bonding, oxygen-defect-related components, and surface-adsorbed oxygen or hydroxyl species. Additional high-resolution scans may also be required for Zn 2p, In 3d, and Sn 3d regions.

The requested XRD analysis is intended to evaluate the crystallinity, phase structure, and structural properties of the ITO/ZnO nanolaminate thin films.

Interested laboratories are requested to provide information regarding sample submission procedures, estimated pricing, turnaround times, and any sample preparation or mounting requirements. Please also indicate any sample size limitations, cleaning recommendations, reporting formats, and the types of raw or processed analytical data included with final deliverables.