XPS Metrology & Chemical Analysis Labs LLC
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XPS Metrology & Chemical Analysis Labs LLC
Profile
Lab Biography
XPS analyzes chemical elements and chemical states in the top 50-60 atoms (5-7 nm, 0.01 microns) of any solid material, powder, plastic, or metal,s such as Rh, Pt, etc.
XPS is able to report the elemental composition of complete unknowns (except for H) at parts per thousand (atom%s).
XPS is used to solve problems that occur during the development and production of new products by analyzing the true surface chemistry of their materials, products, process development changes, and R&D efforts.
Surface can be analyzed, as received, or after ion cleaning. Surface preparation is available.
Bulk is available by cutting or fracturing.
XPS is an extremely versatile chemical analysis tool that measures surface chemistry as well as bulk chemistry of solids or heavy oils.
Qualifications
40 years using XPS,
Auger,
ToF-SIMS,
SEM-EDX,
AFM,
PhD in Chemistry,
6-sigma degree – Black Belt,
Standards & Methodologies
Survey spectra for all elements
XY Maps for all elements
Depth Profiling for all elements to a depth of 3 microns.
Ion cleaning
Solvent cleaning
Industry Types Served
Lab Testing Types Offered
- Advanced Material Characterization
- Chemistry & Compound Analysis
- Coatings & Surface Analysis
- Materials Evaluation & Testing
- Metals & Inorganic Analysis
- Microscopy & Imaging
- Non-Destructive Testing (NDT)
- Physicochemical & Materials Properties
- Spectroscopic & Advanced Imaging